Share:
Features:
-
Low-cost compact tester for high pin count of LSIs
-
Handle maximum 2048-pin device at one measurement.
-
Up to 8-DUT measurement available simultaneously
-
Cover not only open/short test but also leakage test
-
Customize the number of pins for LSIs to be tested
-
Programming study unnecessary by GUI condition setting
Inquiry - AITS-OSL-JC1
